Skip to main content
SpringerLink
Log in

Effect of media on the characteristics of thermistors based on filiform silicon crystals

  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. A. I. Drozhzhin et al., Izmer. Tekh., No. 11 (1978).

  2. A. V. Sandulova et al., Fiz. Tverd. Tela,5, (1963).

  3. S. A. Ammer, Zavod. Lab.,40 (1974).

  4. A. K. Krishtanovich, Electronic Measurements and the Measurement of Parameters of Semiconductor Devices [in Russian], Vysshaya Shkola, Moscow (1974).

    Google Scholar 

  5. G. E. Dul'nev, Heat Exchange in Radioelectronic Devices [in Russian], Gosénergoizdat, Moscow (1963).

    Google Scholar 

  6. G. N. Dul'nev, in Investigations in the Field of Thermal Measurements [in Russian], No. 12, Mashgiz, Moscow (1954).

    Google Scholar 

Download references

Authors
  1. A. I. Drozhzhin
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. N. K. Sedykh
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. E. P. Novokreshchenova
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel'naya Tekhnika, No. 9, 44–47, September, 1979.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Drozhzhin, A.I., Sedykh, N.K. & Novokreshchenova, E.P. Effect of media on the characteristics of thermistors based on filiform silicon crystals. Meas Tech 22, 1091–1096 (1979). https://doi.org/10.1007/BF00830594

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00830594

Keywords

Search

Navigation