Skip to main content
SpringerLink
Log in

Device for automatically measuring the temperature dependences of electrical conductivity, Hall coefficient, and magneto-resistance of semiconductors

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. E. V. Kuchis, Methods of Investigating the Hall Effect [in Russian], Sovetskoe Radio, Moscow (1974).

    Google Scholar 

  2. O. V. Emel'yanenko and T. S. Lagunova, Prib. Tekh. Eksp., No. 6 (1959).

  3. V. Yu. Galkin, Prib. Tekh. Eksp., No. 5 (1976).

  4. Zh. I. Alferov et al., Zavod. Lab.,35, No. 6 (1969).

Download references

Authors
  1. G. L. Lyakhu
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. G. S. Korotchenkov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. I. P. Molodyan
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel'naya Tekhnika, No. 2, pp. 50–51, February, 1979.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Lyakhu, G.L., Korotchenkov, G.S. & Molodyan, I.P. Device for automatically measuring the temperature dependences of electrical conductivity, Hall coefficient, and magneto-resistance of semiconductors. Meas Tech 22, 196–198 (1979). https://doi.org/10.1007/BF00830061

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00830061

Keywords

Search

Navigation