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Standardization of methods of measuring homogeneity in refractive index for insulating and semiconductor crystals

  • General Problems of Metrology and Measurement Techniques
  • Published:
Measurement Techniques Aims and scope

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Authors
  1. I. N. Guseva
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  2. V. I. Sachkov
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  3. B. M. Stepanov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 9, pp. 12–13, September, 1981.

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Guseva, I.N., Sachkov, V.I. & Stepanov, B.M. Standardization of methods of measuring homogeneity in refractive index for insulating and semiconductor crystals. Meas Tech 24, 712–714 (1981). https://doi.org/10.1007/BF00829941

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  • DOI: https://doi.org/10.1007/BF00829941

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