Abstract
A procedure is outlined for calculating the emissivity (spectral and integral, directional and hemispherical) of a semitranslucent plane layer on an opaque base, taking into account temperature gradients in the layer as well as polarization of the rays and multiple reflections at the boundary. The values of emissivity are given for grades K8 and TF1 glass.
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Literature cited
A. A. Men', O. A. Sergeev, and Z. S. Settarova, “Radiation characteristics of semitranslucent materials,” Trudy VNIIM, No. 129/189 (1971).
R. Gardon, J. Amer. Ceram. Soc.,39, No. 8 (1956).
I. R. Beattie and E. Cohen, Brit. J. Appl. Phys., No. 11, 151 (1960).
R. van Laethem et al., J. Amer. Ceram. Soc.,44, No. 7 (1961).
G. D. Rabinovich, Inzh.-Fiz. Zh.,5, No. 9 (1962).
R. E. Chupp and R. Viskanta, J. AIAA,8, No. 3 (1970).
A. A. Men', Inzh.-Fiz. Zh.,20, No. 5 (1971).
A. P. Prishivalko, Reflection of Light from Absorbing Media [in Russian], Minsk (1963).
Additional information
Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 22, No. 3, pp. 526–530, March, 1972.
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Men', I.V., Sergeev, O.A. Calculating the emissivity of semitranslucent materials. Journal of Engineering Physics 22, 373–376 (1972). https://doi.org/10.1007/BF00829475
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DOI: https://doi.org/10.1007/BF00829475