Skip to main content
SpringerLink
Log in

A machine for testing thin films with automatic recording of the tensile stress diagram

  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. L. Maissel and R. Glang (editors), Handbook of Thin-Film Technology, McGraw-Hill, New York (1970).

    Google Scholar 

  2. L. S. Palatnik and A. I. Il'inskii, Usp. Fiz. Nauk,95, No. 4 (1968).

  3. R. I. Vorontsova and A. F. Sirenko, Probl. Prochn., No. 7 (1978).

Download references

Authors
  1. M. E. Shcherbina
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. N. Zaruba
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel'naya Tekhnika, No. 12, pp. 21–22, December, 1981.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Shcherbina, M.E., Zaruba, V.N. A machine for testing thin films with automatic recording of the tensile stress diagram. Meas Tech 24, 1041–1042 (1981). https://doi.org/10.1007/BF00828707

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00828707

Keywords

Search

Navigation