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Literature cited
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Translated from Izmeritel'naya Tekhnika, No. 3, pp. 66–70, March, 1979.
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Bacherikov, V.V., Sachkov, V.I. & Stepanov, B.M. Development prospects for metrological support to parameter measurement on fast processes. Meas Tech 22, 346–352 (1979). https://doi.org/10.1007/BF00828448
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DOI: https://doi.org/10.1007/BF00828448