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IUKO-1 equipment for measuring reflection coefficient

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

Conclusions

The dynamic compensation method which has high sensitivity can conveniently be used to measure small reflection coefficients.

By appropriate excitation of a symmetrical strip line one can generate a TEM mode, suppress interfering higher modes, and ensure measurements of the reflection coefficient that are up to the standard of measurements in free space.

The IUKO-1 instrument with a strip line as the measuring channel employing the dynamic compensation method enables one to measure reflection-coefficient amplitude at a level of −40 dB in the meter waveband.

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Literature cited

  1. A. M. Rasin and Yu. P. Kolmakov, Soviet patent No. 420,956; Byull. Izobret., No. 11 (1974).

  2. L. S. Goldobina et al., Izmeritel. Tekh., No. 7 (1975).

  3. A. M. Rasin et al., Soviet patent No. 446,849; Byull. Izobret., No. 38 (1974).

  4. L. A. Vainshtein, Theory of Diffraction and the Factorization Method [in Russian], Sov. Radio, Moscow (1966).

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  5. G. T. Markov and A. F. Chaplin, Excitation of Electromagnetic Waves [in Russian], Énergiya, Moscow-Leningrad (1967).

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Additional information

Translated from Izmeritel'naya Tekhnika, No. 12, pp. 61–63, December, 1976.

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Kolmakov, Y.P., Rasin, A.M. & Goldobina, L.S. IUKO-1 equipment for measuring reflection coefficient. Meas Tech 19, 1781–1784 (1976). https://doi.org/10.1007/BF00828237

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  • DOI: https://doi.org/10.1007/BF00828237

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