Literature cited
Yu. N. Popov, Prib. Tekh. Eksp., No. 3 (1978).
V. F. Shvets, Izmer. Tekh., No. 7 (1962).
A. I. Sergeeva and Ya. M. Tseitlin, Izmer. Tekhn., No. 7 (1981).
M. S. Shumate, Appl. Opt., No. 2 (1966).
S. D. H. Andreasson and S. E. Gustafsson, J. Opt. Soc. Am.,61, No. 5 (1971).
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Translated from Izmeritel'naya Tekhnika, No. 4, pp. 27–28, April, 1982.
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Sergeeva, A.I. Interference method of measuring transparent dielectric film thickness. Meas Tech 25, 304–305 (1982). https://doi.org/10.1007/BF00827408
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DOI: https://doi.org/10.1007/BF00827408