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Measurement of thermal and electrical conductivities of small cross section samples in the 80–400 °K range

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Abstract

A procedure is described for measuring thermal and electrical conductivities of samples of thermoelectric materials having small cross sections and thicknesses of 1−0.01 mm. The thermal conductivity is determined from the change in resistance of the sample as a result of Joule heating within it. The method does not require a direct measurement of temperature of the sample.

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Authors and Affiliations

  1. Institute of Semiconductors, Academy of Sciences of the USSR, Leningrad

    B. M. Gol'tsman & M. G. Komissarchik

Authors
  1. B. M. Gol'tsman
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  2. M. G. Komissarchik
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Additional information

Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 20, No. 3, pp. 527–533, March, 1971.

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Gol'tsman, B.M., Komissarchik, M.G. Measurement of thermal and electrical conductivities of small cross section samples in the 80–400 °K range. Journal of Engineering Physics 20, 385–389 (1971). https://doi.org/10.1007/BF00826299

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  • DOI: https://doi.org/10.1007/BF00826299

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