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Additional information
Translated from Izmeritel'naya Tekhnika, No. 6, pp. 66–67, June, 1980.
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Stepanov, É.K., Danilenko, V.N. & Matveev, S.V. Metrological support to measurements with Ge (Li) spectrometers in certifying standard sources. Meas Tech 23, 562–564 (1980). https://doi.org/10.1007/BF00825987
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DOI: https://doi.org/10.1007/BF00825987