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Apparatus for measuring the frequency exponent of the spectrum of excess noise of semiconductor devices

  • Measurement of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. A. Van der Ziel, Fluctuation Phenomena in Semiconductors [Russian translation], IL, Moscow (1961).

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  2. V. F. Egorov et al., in: Electronic Techniques, Ser. 8, “Quality control and standardization” [in Russian], TsNII élektronika, Moscow, No. 6(16) (1973).

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  3. V. A. Reinfel'der, The Design of Low-Noise Transistor Input Circuits [in Russian], Svyaz', Moscow (1967).

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Authors
  1. V. F. Egorov
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  2. A. A. Kisurin
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  3. M. I. Shchevelev
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  4. A. N. Makovii
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 8, pp. 76–77, August, 1978.

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Egorov, V.F., Kisurin, A.A., Shchevelev, M.I. et al. Apparatus for measuring the frequency exponent of the spectrum of excess noise of semiconductor devices. Meas Tech 21, 1138–1140 (1978). https://doi.org/10.1007/BF00825145

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  • DOI: https://doi.org/10.1007/BF00825145

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