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Translated from Izmeritel'naya Tekhnika, No. 7, pp. 34–35, July, 1981.
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Sergeeva, A.I., Tseitlin, Y.M. Analyzing accuracy in the measurement of the thickness of dielectric films. Meas Tech 24, 557–559 (1981). https://doi.org/10.1007/BF00824561
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DOI: https://doi.org/10.1007/BF00824561