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Dielectric-constant standards of thin films

  • General Problems of Metrology and Measurement Techniques
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. GOST 14263-69 “GSI. General requirements of Standard Specimens of substances and materials” [in Russian] (1969).

  2. GOST 12508-73 “Electrically insulating Teflon-4 film” [in Russian] (1973).

  3. GOST 19525-74 “Teflon-4 film for capacitors” [in Russian] (1974).

  4. Ya. N. Fel'd, Zh. Eksp. Tekh. Fiz., No. 7 (1938).

  5. “Methods of processing the results of measurements,” in: Proceedings of Metrological Institutes of the USSR [in Russian], No. 172(232) (1975).

  6. “Methods of Processing results of measurements,” in: Proceedings of Metrological Institutes of the USSR [in Russian], No. 134(194) (1972).

  7. N. L. Yatsynina and N. M. Karikh, Reports of the All-Union Scientific-Technical Conference on Radio-Engineering Measurments, Novosibirsk [in Russian], Vol. 1 (1970).

  8. N. M. Karikh and N. M. Zaslonova, Izmeritel. Tekh., No. 8 (1974).

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Authors
  1. N. M. Karikh
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  2. N. M. Zaslonova
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Translated from Izmeritel'naya Tekhnika, No. 9, pp. 16–17, September, 1976.

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Karikh, N.M., Zaslonova, N.M. Dielectric-constant standards of thin films. Meas Tech 19, 1255–1257 (1976). https://doi.org/10.1007/BF00822297

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  • DOI: https://doi.org/10.1007/BF00822297

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