Abstract
The average value and mean-square deviation of the dissipated power are obtained as a function of the thermal resistances of the couplings. Criteria are established for evaluating the optimum values of these resistances.
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Abbreviations
- N:
-
number of transistors in the switch
- Θi :
-
excess temperature of the i-th transistor
- Θoi :
-
same, but the switch is not in the temperature-limited regime
- Θcr i :
-
excess critical temperature of the posistor of the i-th transistor
- Θ, and σΘ:
-
average value and meansquare deviation of the excess temperature of the transistors in the switch
- Θcr and Θcr :
-
same for the posistors in the switch
- Pi :
-
stationary dissipated power in the i-th transistor
- Poi :
-
stationary dissipated power of the i-th transistor, stemming only from the electrical operational regime of the transistor and not depending on its thermal state
- ¯P and σP:
-
average value and mean-square deviation of the stationary dissipated power in the transistor
- Ri :
-
thermal resistance of the i-th transistor when it is ideally thermally insulated from the rest of the transistors
- Ro :
-
same, with Ri=const
- rii :
-
thermal resistance of the i-th transistor taking into account the thermal coupling with the rest of the transistors
- R:
-
same, with rii=const
- rn :
-
same, with ideal thermal coupling between transistors
- Rji :
-
thermal resistance of the coupling of the j-th transistor with the i-th transistor
- Rc :
-
same, with Rji=const
- kc=Ro/R:
-
coefficient of thermal coupling between transistors
Literature cited
V. A. Belyakov and V. V. Togatov, “Analysis of electrical and thermal processes in temperature-limited transistors,” Inzh.-Fiz. Zh.,38, No. 3, 457–464 (1980).
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Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 39, No. 4, PP. 704–709, October, 1980.
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Belyakov, V.A., Togatov, V.V. Evaluation of the effect of thermal coupling in a temperature-limited power transistor switch on the distribution of stationary power dissipation in the transistors. Journal of Engineering Physics 39, 1125–1129 (1980). https://doi.org/10.1007/BF00822149
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DOI: https://doi.org/10.1007/BF00822149