Measurement Techniques

, Volume 21, Issue 2, pp 215–217 | Cite as

Interferometric method of measuring thickness and wedge shape of epitaxial films of mixed ferrite-garnets

  • F. V. Lisovskii
  • V. I. Shcheglov
Linear and Angular Measurements
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Keywords

Physical Chemistry Analytical Chemistry Epitaxial Film Interferometric Method Wedge Shape 

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Literature cited

  1. 1.
    G. A. Smolenskii et al., Microelectronics [in Russian],1, No. 1 (1975).Google Scholar
  2. 2.
    M. A. Boyarchenko' et al., Magnetic Domain Logic and Storage Units [in Russian], Énergiya, Moscow (1974).Google Scholar
  3. 3.
    I. G. Avaeva et al., Microelectronics [in Russian],4, No. 4 (1975).Google Scholar
  4. 4.
    R. M. Josephs, AIP Conf. Proc.,10, 286 (1973).Google Scholar
  5. 5.
    M. Born and E. Wolf, Principles of Optics, Pergammon, New York (1975).Google Scholar

Copyright information

© Plenum Publishing Corporation 1978

Authors and Affiliations

  • F. V. Lisovskii
  • V. I. Shcheglov

There are no affiliations available

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