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Certifying thin conducting films by means of their skin impedance

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Measurement Techniques Aims and scope

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Literature cited

  1. V. V. Gavrilin and Yu. K. Grigulis, Izv. Akad. Nauk Latv. SSR, Ser. Fiz. Tekh. Nauk, No. 4 (1976).

  2. V. V. Gavrilin and Yu. K. Grigulis, Izv. Akad. Nauk Latv. SSR, Ser. Fiz. Tekh. Nauk, No. 6 (1976).

  3. Yu. K. Grigulis, An Electromagnetic Method of Analyzing Laminated Semiconductor and Metallic Structures [in Russian], Zinatne, Riga (1970).

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Authors
  1. Yu. K. Grigulis
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  2. V. V. Gavrilin
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Translated from Izmeritel'naya Tekhnika, No. 2, pp. 37–40, February, 1978.

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Grigulis, Y.K., Gavrilin, V.V. Certifying thin conducting films by means of their skin impedance. Meas Tech 21, 207–211 (1978). https://doi.org/10.1007/BF00821146

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  • DOI: https://doi.org/10.1007/BF00821146

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