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Improving operating characteristics of x-ray flourescence gamma coating-thickness meters based on scintillation counters using NaI(T1) crystals

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Measurement Techniques Aims and scope

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Literature cited

  1. L. N. Yadchenko et al., in: Transactions of the 2nd Zonal Conference on the Use of Isotopes and Ionizing Radiation in the National Economy of the Urals [in Russian], Sverdlovskii Dom Tekhniki, Sverdlovsk (1971).

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  2. G. Grem, G. Toby, and L. Houseman (editors), The Design and Use of Operational Amplifiers [Russian translation], Mir, Moscow (1974).

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  3. B. S. Novisov et al., Soviet Patent No. 481867, Byul. Izobret., No. 31 (1975).

  4. G. Amsel et al., Nucl. Instrum. Methods,71, No. 1 (1967).

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Authors
  1. A. S. Maksimenko
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  2. A. V. Zhukov
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  3. B. S. Novisov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 2, pp. 32–33, February, 1978.

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Maksimenko, A.S., Zhukov, A.V. & Novisov, B.S. Improving operating characteristics of x-ray flourescence gamma coating-thickness meters based on scintillation counters using NaI(T1) crystals. Meas Tech 21, 197–198 (1978). https://doi.org/10.1007/BF00821142

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  • DOI: https://doi.org/10.1007/BF00821142

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