Soviet Physics Journal

, Volume 11, Issue 2, pp 76–77 | Cite as

The dependence of the hall emf on the thickness of the specimen

  • V. L. Kon'kov
  • L. N. Ivanova
  • A. V. Maiorov
Brief Communications
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References

  1. 1.
    Semiconductors in Science and Technology [in Russian], AN SSSR, 1958.Google Scholar
  2. 2.
    V. N. Bogomolov, Devices with Hall and Magnetoresistance Detectors [in Russian], Energoizdat, 1961.Google Scholar
  3. 3.
    V. L. Kon'kov, Fiz. tverd. tela, 6, no. 1 308, 1964.Google Scholar
  4. 4.
    V. L. Kon'kov, Izv. VUZ. Fizika, no. 5, 91, 1964.Google Scholar
  5. 5.
    N. N. Mirolyubov, M. V. Kostenko, M. L. Levinshtein, and N. N. Tikhodeev, Methods of Calculating Electrostatic Fields [in Russian], Vysshaya shkola, 1963.Google Scholar

Copyright information

© Consultants Bureau 1972

Authors and Affiliations

  • V. L. Kon'kov
    • 1
  • L. N. Ivanova
    • 1
  • A. V. Maiorov
    • 1
  1. 1.Gor'kii Technical Physics Research InstituteUSSR

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