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Measurement of electrical-conductivity anisotropy in semiconductor layers by four-probe method

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Literature cited

  1. S. V. Airapetyants and M. S. Bresler, Fiz. Tverd. Tela,1, No. 1, 152 (1959).

    Google Scholar 

  2. J. D. Wasschir, Phil. Res. Repts.,16, No. 4, 301 (1961).

    Google Scholar 

  3. V. L. Kon'kov, Fiz. Tverd. Tela,6, No. 1, 304 (1964).

    Google Scholar 

  4. N. N. Lebedev, I. P. Skal'skaya, and Ya. S. Uflyants, in: Problems of Mathematical Physics [in Russian], Gostekhizdat (1955).

  5. I. S. Grandshtein and I. M. Ryzhik, Tables of Integrals, Sums, Series, and Products [in Russian], Section 1, Fizmatgiz, Moscow (1960).

    Google Scholar 

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Authors and Affiliations

  1. A. M. Gor'kii State Education Institute, USSR

    Z. I. Islyamov & V. L. Kon'kov

Authors
  1. Z. I. Islyamov
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  2. V. L. Kon'kov
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 8, pp. 143–146, August, 1971.

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Islyamov, Z.I., Kon'kov, V.L. Measurement of electrical-conductivity anisotropy in semiconductor layers by four-probe method. Soviet Physics Journal 14, 1143–1145 (1971). https://doi.org/10.1007/BF00820087

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  • DOI: https://doi.org/10.1007/BF00820087

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