Conclusions
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1.
It has been shown that parallel displacements of unit-cell groups for rows of atoms perpendicular to the reflecting plane can alter the integral intensities and shapes of diffraction lines.
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2.
These changes are not taken into account by (2), which is the basis of the method proposed by Averbach and Warren to determine block size and microstress via harmonic analysis of line shapes.
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3.
The reason for this lack of agreement is to be sought in the very wide limits of integration with respect to h1 and h2 (from −1/2 to 1/2) in (1).
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4.
P(2Θ) is affected by integration of the interference function within the main maximum when there are displacements of atomic rows perpendicular to the reflecting plane.
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5.
One can use the Warren-Averbach method only for distortions such that there is no mutual displacement of the atomic rows relative to their position in the undistorted lattice.
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Literature cited
V. V. Kukol', Fiz. Tverd. Tela,4, No. 3, 724 (1962).
B. E. Warren and B. L. Averbach, J. Appl. Phys.,21, 595 (1950).
James, the Optical Principles of the Diffraction of X-Rays [Russian translation], IL, Moscow (1950).
M. A. Krivoglaz, Theory of X-Ray and Thermal-Neutron Scattering for Real Crystals [in Russian], Nauka, Moscow (1967).
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 8, pp. 34–40, August, 1971.
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Vorob'ev, G.M. Determination of microstructures and block sizes from diffraction-line shapes. Soviet Physics Journal 14, 1046–1050 (1971). https://doi.org/10.1007/BF00820064
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DOI: https://doi.org/10.1007/BF00820064