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Measurement of the electrical properties of dielectrics and semiconductors by means of a transcritical-waveguide cavity

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Soviet Physics Journal Aims and scope

Abstract

A transcritical-waveguide cavity with a transverse pin can be used to measure the electrical properties of dielectrics and semiconductors. The corresponding relations are derived. This method is suitable for measurements in the decimeter and centimeter ranges and can be used with extremely small samples.

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Literature cited

  1. A. A. Brandt, Ultrahigh Frequency Study of Dielectrics [in Russian], GIFML, Moscow (1963).

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  2. V. N. Detinko and T. L. Levdikova, Radiotekh. i Élektron.,12, No. 2, 348 (1967).

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Authors and Affiliations

  1. V. D. Kuznetsov Siberian Physicotechnical Institute, Tomsk State University, USSR

    T. L. Levdikova

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  1. T. L. Levdikova
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 1, pp. 88–91, January, 1971.

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Levdikova, T.L. Measurement of the electrical properties of dielectrics and semiconductors by means of a transcritical-waveguide cavity. Soviet Physics Journal 14, 66–68 (1971). https://doi.org/10.1007/BF00819862

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  • DOI: https://doi.org/10.1007/BF00819862

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