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Experimental comparison of four-point methods for measuring the hall effect and the electrical conductivity

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Abstract

Four methods for measuring the Hall constant and the resistivity of thin semiconductor plates (the van der Pauw, Kon'kov, Lange, and Buchler-Pearson methods) have been experimentally checked and compared. The dependence of the corrections CH and C p on the ratio d/c has been studied over the range √2–10.

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Literature cited

  1. Van der Pauw, Philips Research Reports,13, No. 1 (1958).

  2. V. L. Kon'kov, Fiz. Tverd. Tela,6, 308 (1964).

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  3. J. Lange, J. Appl. Phys.,35, No. 9 (1964).

  4. M. G. Buchler and G. L. Pearson, Solid-State Electronics, Vol. 9 (1966), p. 395.

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Authors and Affiliations

  1. Kuznetsov Siberian Physicotechnical Institute, USSR

    Yu. G. Kataev, L. G. Lavrent'eva & I. P. Pogrebnyak

Authors
  1. Yu. G. Kataev
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  2. L. G. Lavrent'eva
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  3. I. P. Pogrebnyak
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, Vol. 12, No. 2, pp. 20–25, February, 1969.

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Kataev, Y.G., Lavrent'eva, L.G. & Pogrebnyak, I.P. Experimental comparison of four-point methods for measuring the hall effect and the electrical conductivity. Soviet Physics Journal 12, 149–153 (1969). https://doi.org/10.1007/BF00819305

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  • DOI: https://doi.org/10.1007/BF00819305

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