Abstract
A method of measuring the microhardness and tensile strength of thin films has been devised, and this has been used to investigate copper and aluminum films obtained by condensation in vacuum. The connection between the strength of the films and the condensation conditions has been studied.
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Palatnik, L.S., Il'inskii, A.I., Fedorov, G.V. et al. On the connection between the strength and conditions of preparation of copper and aluminum vacuum condensates. Soviet Physics Journal 9, 73–77 (1966). https://doi.org/10.1007/BF00818499
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DOI: https://doi.org/10.1007/BF00818499