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Measurement Techniques

, Volume 18, Issue 11, pp 1675–1677 | Cite as

Measuring the spectral density of the gate noise current in field-effect transistors with a p-n junction

  • L. P. Feshchenko
  • V. Z. Chernikov
Measurements of Electrical and Magnetic Quantities
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Keywords

Physical Chemistry Analytical Chemistry Spectral Density Noise Current Gate Noise 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Literature cited

  1. 1.
    A. vander Zeil, Noise, Sources, Description, and Measurement [Russian translation], Izd. Sovetskoe Radio, Moscow (1973).Google Scholar
  2. 2.
    V. N. Galkin, Field-Effect Transistors in Sensitive Amplifiers [in Russian], Izd. Énergiya, Leningrad (1974).Google Scholar
  3. 3.
    A. vander Zeil, Proc. IEEE,51, No. 3 (1963).Google Scholar
  4. 4.
    F. M. Klaassen and J. R. Robinson, Trans. IEEE, Electron Devices,17, No. 10 (1970).Google Scholar
  5. 5.
    R. Kesser, TIIÉR,58, No. 8 (1970).Google Scholar
  6. 6.
    V. Z. Chernikov, Trudy VNIIFTRI, No. 2(32) (1970).Google Scholar

Copyright information

© Plenum Publishing Corporation 1976

Authors and Affiliations

  • L. P. Feshchenko
  • V. Z. Chernikov

There are no affiliations available

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