Measurement Techniques

, Volume 18, Issue 11, pp 1675–1677 | Cite as

Measuring the spectral density of the gate noise current in field-effect transistors with a p-n junction

  • L. P. Feshchenko
  • V. Z. Chernikov
Measurements of Electrical and Magnetic Quantities


Physical Chemistry Analytical Chemistry Spectral Density Noise Current Gate Noise 
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Literature cited

  1. 1.
    A. vander Zeil, Noise, Sources, Description, and Measurement [Russian translation], Izd. Sovetskoe Radio, Moscow (1973).Google Scholar
  2. 2.
    V. N. Galkin, Field-Effect Transistors in Sensitive Amplifiers [in Russian], Izd. Énergiya, Leningrad (1974).Google Scholar
  3. 3.
    A. vander Zeil, Proc. IEEE,51, No. 3 (1963).Google Scholar
  4. 4.
    F. M. Klaassen and J. R. Robinson, Trans. IEEE, Electron Devices,17, No. 10 (1970).Google Scholar
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    R. Kesser, TIIÉR,58, No. 8 (1970).Google Scholar
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    V. Z. Chernikov, Trudy VNIIFTRI, No. 2(32) (1970).Google Scholar

Copyright information

© Plenum Publishing Corporation 1976

Authors and Affiliations

  • L. P. Feshchenko
  • V. Z. Chernikov

There are no affiliations available

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