Measurement Techniques

, Volume 18, Issue 11, pp 1672–1674 | Cite as

Determining the parameters of the calibration network used for the measurement of transistor characteristics

  • A. I. Khar'ko
  • Ya. N. Druzhilovskii
  • É. N. Smirnova
Measurements of Electrical and Magnetic Quantities


Physical Chemistry Analytical Chemistry Transistor Characteristic Calibration Network 
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Literature cited

  1. 1.
    Government Standard 18604.1-73 Transistors. Methods of Measuring the Time Constant at a High Frequency [in Russian].Google Scholar
  2. 2.
    M. G. Agapova et al., Transistors. Methods of Their Testing and Measuring Their Parameters [in Russian]. Izd. Sovetskoe Radio, Moscow (1968).Google Scholar

Copyright information

© Plenum Publishing Corporation 1976

Authors and Affiliations

  • A. I. Khar'ko
  • Ya. N. Druzhilovskii
  • É. N. Smirnova

There are no affiliations available

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