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Measurement Techniques

, Volume 18, Issue 11, pp 1672–1674 | Cite as

Determining the parameters of the calibration network used for the measurement of transistor characteristics

  • A. I. Khar'ko
  • Ya. N. Druzhilovskii
  • É. N. Smirnova
Measurements of Electrical and Magnetic Quantities
  • 13 Downloads

Keywords

Physical Chemistry Analytical Chemistry Transistor Characteristic Calibration Network 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Literature cited

  1. 1.
    Government Standard 18604.1-73 Transistors. Methods of Measuring the Time Constant at a High Frequency [in Russian].Google Scholar
  2. 2.
    M. G. Agapova et al., Transistors. Methods of Their Testing and Measuring Their Parameters [in Russian]. Izd. Sovetskoe Radio, Moscow (1968).Google Scholar

Copyright information

© Plenum Publishing Corporation 1976

Authors and Affiliations

  • A. I. Khar'ko
  • Ya. N. Druzhilovskii
  • É. N. Smirnova

There are no affiliations available

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