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Apparatus for measuring the spectral distribution off α noise of p-n-p and n-p-n transistors in the 20 Hz–30 kHz frequency band

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. A. Van der Ziel, Electronics,39, No. 24 (1966).

  2. G. F. Kopyl et al., Radioélektronika,11 No. 2 (1968).

  3. N. M. Teterich, Noise Generators and Measurement of Noise Characteristics [in Russian], Énergiya, Moscow (1968).

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  4. R. A. Valitov et al., Measurement of the Parameters of Semiconductor Devices [in Russian], Khar'kov Univ., Khar'kov (1960).

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  5. Yu. S. Karpov et al., “Errors in measuring the noise factor of transistors at low frequencies”, Izv. Vuzov Priborostroenie,8, No. 2 (1965).

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Authors
  1. I. Ya. Frenkel'
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Translated from Izmeritel'naya Tekhnika, No. 6, pp. 37–39, June, 1975.

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Frenkel', I.Y. Apparatus for measuring the spectral distribution off α noise of p-n-p and n-p-n transistors in the 20 Hz–30 kHz frequency band. Meas Tech 18, 854–857 (1975). https://doi.org/10.1007/BF00817694

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  • DOI: https://doi.org/10.1007/BF00817694

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