Conclusions
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1.
Optimization of the accuracy ratio in the testing of measuring instruments (in the sense of minimizing the losses due to measuring errors) may be effected by reference to data already available in the metrological service.
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2.
The parameter t0 may only be optimized for measuring devices of the special-purpose type. For general-purpose measuring devices one simply has to use a reasonable value of t0.
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Literature cited
E. F. Dolinskii, Izmeritel'. Tekh., No. 3 (1958).
K. A. Reznik, Metrologiya, No. 4 (1971).
B. V. Vasil'ev and K. A. Reznik, Reports of the Second Republican Scientific-Technical Conference on Metrology, Part I [in Russian], Tbilisi (1972).
Additional information
Translated from Izmeritel'naya Tekhnika, No. 6, pp. 12–14, June, 1975.
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Reznik, K.A. Optimization of the accuracy relationships when testing measuring devices. Meas Tech 18, 810–813 (1975). https://doi.org/10.1007/BF00817680
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DOI: https://doi.org/10.1007/BF00817680