Soviet Physics Journal

, Volume 11, Issue 6, pp 93–93 | Cite as

Electrical strength of thin-film capacitors based on sio with bulk electrodes

  • A. N. Rudnev
Brief Communications and Letters to the Editor


Electrical Strength Bulk Electrode 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


  1. 1.
    G. A. Vorob'ev, FTT,10, 266, 1968.Google Scholar
  2. 2.
    P. P. Budenstein and P. J. Hayes, J. Appl. Phys.,38, 2837, 1967.Google Scholar
  3. 3.
    N. Klein, H. Gafni, and H. I. David, 1964 Symposium on the Physics of Failure in Electronics, PADC, Series in Reliability, Chicago,3, 317, 1965.Google Scholar
  4. 4.
    A. N. Rudnev, collection: Metal Physics [inRussian], AN UkrSSR, 1968.Google Scholar
  5. 5.
    A. N. Rudnev, Proceedings of the Conference on Computing-System Problems, Technical Section [in Russian], IM SO AN SSSR, Novosibirsk, 1968.Google Scholar
  6. 6.
    G. A. Vorob'ev, V. A. Mukhachev, and A. N. Rudnev, ZhTF (in press).Google Scholar
  7. 7.
    A. N. Rudnev and G. A. Efimenko, Izv. VUZ. Fizika [Soviet Physics Journal], no. 3, 19, 1968.Google Scholar
  8. 8.
    G. N. Shuppe, Electron Emission from Metal Crystals [in Russian], Izd. SAGU, Tashkent, 1957.Google Scholar
  9. 9.
    A. N. Korobov and V. F. Korzo, FTT,8, 613, 1966.Google Scholar
  10. 10.
    V. F. Korzo, FTT,8, 2500, 1966.Google Scholar

Copyright information

© Consultants Bureau 1972

Authors and Affiliations

  • A. N. Rudnev
    • 1
  1. 1.Tomsk Institute of Radioelectronics and Engineering ElectronicsUSSR

Personalised recommendations