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Optimum relationships for calculating the error of radioisotopic instruments

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Measurement Techniques Aims and scope

Conclusion

We have investigated the conditions for the minimum error in measuring quantities relating to nuclear radiation fluxes by taking into account all types of error in the operating measuring circuit. The effect of individual error components on the existence of a minimum has been analyzed. It has been shown that the basic relationships used in engineering calculations constitute particular cases, which are derived as limiting estimates from the above expressions. Theoretical expressions interrelating the optimum measuring conditions are given fot the cases encountered in design practice.

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Literature cited

  1. O. N. Vavilov and I. M. Frank, in: New Methods for Measuring Thickness [in Russian], Izd. AN SSSR, Moscow (1946).

    Google Scholar 

  2. A. M. Bogachev, B. I. Verkhovskii, and A. N. Makarov, Zavod. Lab., No. 7 (1955).

  3. P. P. Kremlevskii and N. F. Gonek, Izmeritel. Tekh., No. 2 (1966).

  4. K. S. Klempner, I. M. Cherednichenko, and N. N. Shumilovskii, Avtometriya, No. 3 (1966).

  5. K. S. Klempner, I. M. Cherednichenko, and N. N. Shumilovskii, Avtometriya, No. 2 (1965).

  6. L. K. Tatochenko, Radioactive Isotopes in Measuring Techniques [in Russian], Atomizdat, Moscow (1961).

    Google Scholar 

  7. M. A. Zemel'man, Izmeritel. Tekh., No. 1 (1959).

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Translated from Izmeritel'naya Tekhnika, No, 5, pp. 71–73, May, 1973.

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Klempner, K.S., Cherednichenko, I.M. Optimum relationships for calculating the error of radioisotopic instruments. Meas Tech 16, 746–750 (1973). https://doi.org/10.1007/BF00815832

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  • DOI: https://doi.org/10.1007/BF00815832

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