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X-ray study of the crystal structure of silicon formed during radiolysis in a ceramic

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Literature cited

  1. S. S. Tolkachev, Tables of Interplanar Distances [in Russian], Leningradskogo Universiteta (1955).

  2. A. I. Kitaigorodskii, X-Ray Analysis of Fine-Crystalline and Amorphous Materials [in Russian], GITTL, Moscow-Leningrad (1952).

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  3. S. S. Gorelik, A. N. Rastorguev, and Yu. A. Skakov, Analysis of Metals by X-Ray Diffraction and Electron Diffraction [in Russian], Metallurgizdat, Moscow (1963).

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Authors and Affiliations

  1. Tomsk Institute of Radio Electronics and Electronic Engineering, USSR

    V. M. Belousov & L. N. Konopleva

Authors
  1. V. M. Belousov
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  2. L. N. Konopleva
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Translated from Izvestiya Vysshikh Uchenykh Zavedenii Fizika, Vol. 12, No. 5, pp. 130–131, May, 1969.

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Belousov, V.M., Konopleva, L.N. X-ray study of the crystal structure of silicon formed during radiolysis in a ceramic. Soviet Physics Journal 12, 656–658 (1969). https://doi.org/10.1007/BF00814863

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  • DOI: https://doi.org/10.1007/BF00814863

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