Conclusions
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1.
There are many theoretical and experimental papers on automatic fault location in electronic systems; individual representatives of such equipment have been designed, but these have specific purposes, while they are also of considerable complexity, so they have not found general use in servicing or repair of complex equipment.
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2.
A major advance in this region may be obtained from contactless methods of parameter measurement via secondary features bearing information not only about the output parameters of the elements but also about latent defects. It would seem that IR radiation from elements is very promising in this respect. Much attention should be given to perfecting such methods.
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Additional information
Translated from Izmeritel'naya Tekhnika, No. 11, pp. 90–91, November, 1973.
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Vlasov, N.I. Design of automatic equipment for detecting faults in electronic measuring equipment. Meas Tech 16, 1739–1741 (1973). https://doi.org/10.1007/BF00814607
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DOI: https://doi.org/10.1007/BF00814607