Conclusions
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1.
The formulas allow one to determine the optimal slit width and scan amplitude for a given system, which can provide sensitivities higher by 5.4–22.4% than those derived from the previously accepted optimal relation between these parameters as derived without allowance for diffraction.
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2.
The calculated points have only a small spread around the approximating straight lines, so (10) and (11) can be used for wide ranges in image width.
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3.
The zero-point sensitivity of such a device has a very broad peak, so the actual parameters do not have to correspond closely to the optimal ones.
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Literature cited
Yu. L. Polunov, Photoelectric Microscopes and Autocollimators in Lathe Construction [in Russian], Moscow, NIIMASh (1971).
J. Clark and K. Cook., J. Sci Instr., No. 9 (1956).
V. M. Sikharulidze, N. V. Trishin, and G. P. Zedginidze, Izmeritel'. Tekh., No. 7 (1972).
A. T. Ashcheulov, Opt.-Mekh. Prom., No. 6 (1960).
I. S. Gradshtein and I. M. Ryzhik, Tables of Integrals, Sums, Series, and Products [in Russian], Fizmatgiz, Moscow (1962).
Additional information
Translated from Izmeritel'naya Tekhnika, No. 11, pp. 20–23, November, 1973.
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Sikharulidze, V.M., Trishin, N.V. & Zedginidze, G.P. Choice of best modulator operating conditions for photometric photoelectric microscopes and autocollimators. Meas Tech 16, 1631–1633 (1973). https://doi.org/10.1007/BF00814573
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DOI: https://doi.org/10.1007/BF00814573