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Calibration of meters for measuring semiconductor diodes by means of the capacitance-resistance divider method

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Literature cited

  1. GOST 10964-64 on “Methods for measuring capacitances of semiconductor diodes.”

  2. A. S. Berlin, R. B. Bukuri, and V. M. Davydov, Ya. A. Fedotov (editor), in: Semiconductor Devices and Their Application [in Russian], No. 20, Sov. Radio, Moscow (1968).

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  3. V. S. Blagoveshchenskii and G. Kh. Zyryanov, Author's Certificate No. 277936, Byull. Izobr., No. 25 (1970).

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Authors
  1. V. S. Blagoveshchenskii
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Translated from Izmeritel'naya Tekhnika, No. 2, pp. 69–71, February, 1973.

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Blagoveshchenskii, V.S. Calibration of meters for measuring semiconductor diodes by means of the capacitance-resistance divider method. Meas Tech 16, 268–270 (1973). https://doi.org/10.1007/BF00812573

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  • DOI: https://doi.org/10.1007/BF00812573

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