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Measuring the conductance and its relation to the temperature of polycrystalline semiconductors under pressure

  • Measurements of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. R. Smith, Semiconductors [Russian translation], IIL, Moscow (1962).

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  2. V. I. Anisimov and A. P. Golubev, Transistor Modulators [in Russian], Énergiya, Moscow (1964).

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  3. Collection of articles entitled: Semiconductors in Measurement Techniques [in Russian], Énergiya, Moscow (1964).

  4. A. R. Turki et al., DAN SSSR, No. 5 (1962).

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Authors
  1. V. I. Alikin
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Additional information

Translated from Izraeritel'naya Tekhnika, No. 2, pp. 52–54, February, 1973.

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Alikin, V.I. Measuring the conductance and its relation to the temperature of polycrystalline semiconductors under pressure. Meas Tech 16, 240–243 (1973). https://doi.org/10.1007/BF00812564

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  • DOI: https://doi.org/10.1007/BF00812564

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