Abstract
The dislocation structure of NiO single crystals used in diffusion studies has been examined by transmission electron microscopy. The crystals contain dislocations (the dislocation density being 4 × 1012 m−2) that are probably a result of the growth process. The dislocations have a Burgers vector ofa/2 〈110〉. On annealing at temperatures above 1400° C the density is reduced to ∼ 7 × 1011 m−2, most of the dislocations forming low angle boundary arrays. The dislocation density was found to be much greater in the vicinity (within 1μm) of a mechanically polished surface.
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Sears, J.S. Transmission electron microscopy of dislocations in nickel oxide single crystals. J Mater Sci 13, 2455–2461 (1978). https://doi.org/10.1007/BF00808061
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DOI: https://doi.org/10.1007/BF00808061