Abstract
Both inner surface and void system of technicalPAN-fibres (Wolpryla 65) have been determined by means of low temperature gas sorption, and by X-ray small angle analysis. We find similar trends for both methods, but different absolute values. These differences are explained by structural considerations. A model for the structure of the voids system is derived from the X-ray data.
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Herrn Prof. Dr.H. Janeschitz-Kriegl anläßlich seines 60. Geburtstages gewidmet
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Jacobasch, HJ., Grosse, I., Hermel, G. et al. Zur Porenanalyse anPAN-Fasern durch Röntgenkleinwinkelanalyse und Tieftemperaturgassorptionsmessungen. Monatsh Chem 115, 1269–1278 (1984). https://doi.org/10.1007/BF00798304
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DOI: https://doi.org/10.1007/BF00798304