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Soviet Powder Metallurgy and Metal Ceramics

, Volume 31, Issue 10, pp 854–858 | Cite as

Frequency relationship of the active constituent of the resistance of Sn0.9Sb0.1O2 powder-base thick-film resistors

  • D. E. Dyshel'
Methods of Investigation and Properties of Powder Materials

Keywords

Active Constituent Frequency Relationship 
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Literature cited

  1. 1.
    B. R. Marathe, “Recent trends in thick-film hybrid circuits,” J. Inst. Electron. Telecomm.,24, No. 4, 213–218 (1978).Google Scholar
  2. 2.
    S. Ya. Poizner, Ya. M. Penchanskii, and A. Yu. Klimov, “Experience in the development of thick-film superhigh frequency micromodules,” in: The Technology of Communications. Technology of Production and Equipment Series [in Russian], No. 2 (1980), pp. 115–118.Google Scholar
  3. 3.
    G. Pike and C. Seager, “Electrical properties and conduction mechanisms of Ru-based thick-film (cermet) resistors,” J. Appl. Phys.,48, No. 12, 5151–5169 (1977).Google Scholar
  4. 4.
    W. H. De Jen, R. W. J. Geuskens, and G. E. Pike, “Conduction mechanisms and 1/f-noise in thick-film resistors with Pb3Rh7O15 and Pb2Ru2O7,” ibid.,52, No. 6, 4128–4134 (1981).Google Scholar
  5. 5.
    B. M. Rud', E. Ya. Tel'nikov, and L. T. Akulova, “The conductivity of thick refractory boride-base films in an ac,” Poroshk. Metall., No. 4, 76–79 (1983).Google Scholar
  6. 6.
    A. I. Antonyan, V. G. Grebenkina, and T. P. Potashnikova, “Thick-film ac resistors based on alloyed tin dioxide,” in: The Technology of Communications. Technology of Production and Equipment Series [in Russian], No. 2 (1980), pp. 53–58.Google Scholar
  7. 7.
    K. P. D'yachenko, D. I. Zorin, P. V. Novitskii, et al., Electrical Measurements [in Russian], Vysshaya Shkola, Moscow (1972).Google Scholar
  8. 8.
    N. Mott and E. Davis, Electron Processes in Noncrystalline Substances [Russian translation], Mir, Moscow (1986).Google Scholar
  9. 9.
    D. M. Kazarnovskii and B. M. Tareev, Tests of Electrical Insulation Materials and Parts [in Russian], énergiya, Leningrad (1980).Google Scholar
  10. 10.
    R. G. Ainshtein, L. A. Bespamyatnova, V. P. Komarova, et al., “High-temperature glass as a matrix element of silver-palladium resistors,” Elektron. Promysh., No. 2, 26–28 (1976).Google Scholar
  11. 11.
    P. T. Oreshkin, The Physics of Semiconductors and Dielectrics [in Russian], Vysshaya Shkola, Moscow (1977).Google Scholar
  12. 12.
    D. E. Dyshel', B. M. Rud', V. P. Smirnov, and M. D. Smolin, “The influence of structure on the electrical resistance of alloyed tin dioxide-base thick films,” Izv. Akad. Nauk SSSR Neorgan. Mater.,21, No. 10, 1706–1709 (1985).Google Scholar
  13. 13.
    D. E. Dyshel', B. M. Rud', M. D. Smolin, and I. A. Stoyanov, “The electrical conductivity of granulated ‘alloyed tin dioxide-glass’ films,” Radiotekh. élektron.,33, No. 10, 2214–2216 (1988).Google Scholar
  14. 14.
    M. Brodski (ed.), Amorphous Semiconductors [Russian translation], Mir, Moscow (1982).Google Scholar
  15. 15.
    I. P. Zvyagin, Kinetic Phenomena in Disordered Semiconductors [in Russian], Izd. Mosk. Univ., Moscow (1984).Google Scholar
  16. 16.
    A. Kubovy and O. Stefan, “Frequency dependence of the ac conductivity of resistive thick film,” Thin Solid Films,135, No. 1, 9–12 (1986).Google Scholar

Copyright information

© Plenum Publishing Corporation 1993

Authors and Affiliations

  • D. E. Dyshel'
    • 1
  1. 1.Institute of Problems of Material ScienceAcademy of Sciences of the UkraineUkraine

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