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Study of the surface of finely divided titanium nitride by x-ray photoelectron spectroscopy

  • Theory, Production Technology, and Properties of Powders and Fibers
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Soviet Powder Metallurgy and Metal Ceramics Aims and scope

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Literature cited

  1. L. Ramqvist, K. Hamrin, G. Johansson, A. Falman, and C. Nordling, “Charge transfer in transition metal carbides and related compounds studied by ESCA,” J. Phys. Chem. Solids,30, 1835–1847 (1969).

    Google Scholar 

  2. Yu. M. Shul'ga, V. N. Troitskii, M. I. Aivazov, and Yu. G. Borod'ko, “X-ray photoelectron spectra of scandium, titanium, vanadium, and chromium mononitrides,” Zh. Neorg. Khim.,21, 2621–2624 (1976).

    Google Scholar 

  3. G. V. Samsonov, Nitrides [in Russian], Naukova Dumka, Kiev (1969).

    Google Scholar 

  4. V. N. Troitskii, M. I. Aivazov, V. M. Kuznetsov, and V. S. Koryagin, “Use of a superhigh frequency discharge for the manufacture of titanium nitride powder,” Poroshk. Metall., No. 3, 8–11 (1972).

    Google Scholar 

  5. J. Hojo, O. Iwamoto, Y. Maruyama, and A. Kato, “Defect structure and thermal and electrical properties of Ti nitride and V nitride powders,” J. Less-Common Met.,53, 265–276 (1977).

    Google Scholar 

  6. V. I. Nefedov, N. P. Sergushin, I. M. Band, M. B. Trzhaskovskaya, and Ya. V. Salyn', “Relative intensities in x-ray electron spectra,” Izv. Akad. Nauk SSSR, Ser. Khim., No. 9, 72–78 (1975).

    Google Scholar 

  7. R. Flitsch and S. I. Raider, “Electron mean escape depths and x-ray photoelectron spectra of thermally oxidized silicon dioxide films on silicon,” J. Vacuum Sci. Technol.,12, 305–308 (1975).

    Google Scholar 

  8. G. Hollinger, Y. Jugnet, P. Pertosa, and Tran Minh Due, “X-ray photoelectron spectroscopy of thermally grown silicon dioxide on silicon,” Chem. Phys. Lett.,36, 441–445 (1975).

    Google Scholar 

  9. I. Lindau and W. E. Spicer, “The probing depth in photoemission and Auger-electron spectroscopy,” J. Electron Spectry. Related Phenomena,3, 409–413 (1974).

    Google Scholar 

  10. O. Schmitz-Dumont and K. Steinberg, “Mischkristallbildung im System TiO-TiN,” Naturwissenschaften,41, 117 (1954).

    Google Scholar 

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Translated from Poroshkovaya Metallurgiya, No. 10(202), pp. 1–5, October 1979.

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Shul'ga, Y.M., Troitskii, V.N. Study of the surface of finely divided titanium nitride by x-ray photoelectron spectroscopy. Powder Metall Met Ceram 18, 681–684 (1979). https://doi.org/10.1007/BF00797433

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  • DOI: https://doi.org/10.1007/BF00797433

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