Soviet Powder Metallurgy and Metal Ceramics

, Volume 5, Issue 3, pp 224–227 | Cite as

Use of X-rays to study the atomic scattering factors of the components of titanium carbide and the defect concentration of its structure

  • M. P. Arbuzov
  • B. V. Khaenko
Methods of Investigation and Properties of Materials
  • 31 Downloads

Summary

  1. 1.

    It is found that, for sin θ/λ≤0.6, the atomic scattering factors of Ti and C in titanium carbide differ from the corresponding quantities for neutral atoms. These deviations are apparently due to changes in the state of the Ti and C atoms, accompanying the formation of the titanium carbide structure.

     
  2. 2.

    The defect concentration of the TiC structure, calculated from experimental data measured with sin θ/λ ≥0.65, agrees with the chemical analysis results.

     

Keywords

Experimental Data Titanium Chemical Analysis Carbide Neutral Atom 

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Literature cited

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Copyright information

© Consultants Bureau 1967

Authors and Affiliations

  • M. P. Arbuzov
    • 1
  • B. V. Khaenko
    • 1
  1. 1.Institute of Materials ScienceAcademy of Sciences of the UkrSSRUSSR

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