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An X-ray topographic assessment of cadmium mercury telluride

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Abstract

This paper describes an X-ray topographic (Berg-Barrett) assessment of cadmium mercury telluride grown by the Bridgman and cast-recrystallize-anneal (CRA) methods. Reflection topographs reveal that the Bridgman material studied consists of large numbers of small grains (0.05 to 0.6 mm) with misorientations from 1 to 9 minutes per grain. In contrast, the CRA material studied had only a few grain boundaries and features consistent with a strained lattice, possibly caused by compositional variations.

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Authors and Affiliations

  1. Philips Research Laboratories, Redhill, Surrey, UK

    K. L. Bye

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  1. K. L. Bye
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Bye, K.L. An X-ray topographic assessment of cadmium mercury telluride. J Mater Sci 14, 619–625 (1979). https://doi.org/10.1007/BF00772722

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  • DOI: https://doi.org/10.1007/BF00772722

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