Installation for investigating the electronic work function of metal subjected to tension in the temperature interval of 20–1200°C
- 22 Downloads
KeywordsTemperature Interval Work Function Electronic Work Function
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
Unable to display preview. Download preview PDF.
- 1.V. P. Melekhin, R. I. Mints, and V. S. Kortov, “Dependence of exoelectron emission on deformation defects,” Metalloved. Term. Obrab. Met., No. 9, 17–20 (1970).Google Scholar
- 2.A. A. Klypin and E. S. Solov'ev, “Connection between electron emission and creep of metallic materials,” Probl. Prochn., No. 11, 45–49 (1976).Google Scholar
- 3.I. Yu. Ievlev and V. P. Melekhin, “Installation for the complex investigation of the electrophysical properties of metals,” in: Technique and Methods of Measuring Exoelectron Emission. Transactions of the Urals Polytechnic Institute [in Russian], No. 215 (1973), pp. 15–18.Google Scholar
- 4.M. G. Lozinskii, Thermal Microscopy of Materials [in Russian], Metallurgiya, Moscow (1976).Google Scholar
- 5.A. A. Sadovnichii, S. S. Kil'chitskaya, and R. O. Litvinov, “Measurement of the distribution of contact potential difference with the aid of a vibrating microelectrode,” Prib. Tekh. Eksp., No. 5, 156–158 (1968).Google Scholar
- 6.M. Grin (editor), Surface Properties of Solids [Russian translation], Mir, Moscow (1972).Google Scholar
- 7.B. M. Tsarev, Contact Potential Difference [in Russian], GITTL, Moscow (1949).Google Scholar
© Plenum Publishing Corporation 1980