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The microstructure of hot-pressed silicon-nitride

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Abstract

Grain morphology, distribution of impurities and inclusions, phases and dislocation structures in two grades of hot-pressed Si3N4 were investigated by means of replica and thin foil transmission microscopy, and by X-ray diffraction, microprobe and Auger analyses. High concentrations of impurities, specifically Ca, were detected at the grain boundaries. Fe-W-Si particles were seen within the grain. Non-densified Si3N4 inclusions were found to be detrimental to the strength. Possible correlations among strength, densification data and distribution of elements and phases are discussed.

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Authors and Affiliations

  1. Materials Science Section, Metallurgy and Metals Processing Department, Westinghouse Research Laboratories, Pittsburgh, Pennsylvania, USA

    Ram Kossowsky

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  1. Ram Kossowsky
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Kossowsky, R. The microstructure of hot-pressed silicon-nitride. J Mater Sci 8, 1603–1615 (1973). https://doi.org/10.1007/BF00754896

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  • DOI: https://doi.org/10.1007/BF00754896

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