Abstract
Tunneling measurements on TlBa2(Ca0.8Y0.2)Cu2O7 taken at low temperatures with a scanning tunneling microscope reveal clear evidence of single electron tunneling behavior. Topographical studies of the film with both scanning tunneling microscopy and atomic force microscopy provide a simple explanation of the source of the ultra small capacitors necessary to explain the single electron tunneling spectra as a natural result of the planar crystal structure of TlBa2(Ca0.8Y0.2)Cu2O7.
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Miller, T.G., Reifenberger, R., McElfresh, M. et al. Single electron tunneling in TlBa2(Ca0.8Y0.2)Cu2O7 thin films at 10K. J Low Temp Phys 94, 239–247 (1994). https://doi.org/10.1007/BF00754669
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DOI: https://doi.org/10.1007/BF00754669