Abstract
Bismuth thin films of various thicknesses between 15 nm and 350 nm were vacuum deposited at room temperature on to glass substrates, immediately after which they were twice heat treated at a uniform rate. During the heat treatment, the resistance changes were monitored and, using these data, the initial lattice distortion energy spectra of as-grown bismuth thin films have been evaluated. It is found that the defects have preferential activation energy values around 1.06 eV, 1.14 eV and 1.32 ev. It is also found that ∫F 0 (E) dE oscillates with thickness, which is attributed to the quantum size effect.
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Das, V.D., Jayaprakash, N. Lattice distortion energy spectra of as-grown bismuth thin films and their thickness dependence. J Mater Sci 17, 1369–1376 (1982). https://doi.org/10.1007/BF00752248
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DOI: https://doi.org/10.1007/BF00752248