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X-ray spectroscopic study of the nature of the oxygen-silicon bond in organosilicon compounds

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Literature Cited

  1. B. Yu. Khel'mer, A. T. Shuvaev, O. E. Shelepin, and L. N. Mazalov, The X-Ray and Photoelectron Spectra of Oxygen-containing Organic Compounds [in Russian], Izd. Rostov. Gos. Univ., Rostov-on-Don (1982).

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Authors and Affiliations

  1. Scientific-Research Institute of Physics, Rostov State University, Russia

    A. T. Shuvaev, B. Yu. Khel'mer, T. L. Krasnova, L. N. Mazalov & T. A. Lyubeznova

  2. Institute of Inorganic Chemistry, Siberian Branch, Academy of Sciences of the USSR, Russia

    A. T. Shuvaev, B. Yu. Khel'mer, T. L. Krasnova, L. N. Mazalov & T. A. Lyubeznova

Authors
  1. A. T. Shuvaev
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  2. B. Yu. Khel'mer
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  3. T. L. Krasnova
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  4. L. N. Mazalov
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  5. T. A. Lyubeznova
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Additional information

Translated from Zhurnal Strukturnoi Khimii, Vol. 25, No. 2, pp. 172–175, March–April, 1984.

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Shuvaev, A.T., Khel'mer, B.Y., Krasnova, T.L. et al. X-ray spectroscopic study of the nature of the oxygen-silicon bond in organosilicon compounds. J Struct Chem 25, 328–330 (1984). https://doi.org/10.1007/BF00747368

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  • DOI: https://doi.org/10.1007/BF00747368

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