References
R. A. Muminov, U. B. Dzhuraev, S. A. Radzhapov, and A. Sh. Iskanderov, “Low-resistancep-Si transit detectors,” At. Énerg.,67, No. 2, 139–140 (1989).
R. A. Muminov, U. B. Dzhuraev, U. N. Pod'yachev, et al., “The effect of electron bombardment on the physical parameters of surface-barrier detectors,” Izv. Akad. Nauk UzSSR. Ser. Fiz.-Mat. Nauk, No. 3, 59–63 (1990).
R. A. Muminov, V. T. Malaeva, S. M. Bukki, et al., “A differential method of monitoring the quality of semiconductor transit diodes,” in: Proceedings of the 39th Conference on Nuclear Spectroscopy and the Structure of the Atomic Nucleus, Nauka, Leningrad (1989), p. 510.
R. A. Muminov, V. T. Malaeva, K. M. Nurbaev, and M. M. Oksman, “The charge properties of the surface of the entrance window of diode p-i-n-structures,” in: Proceedings of the 38th Conference on Nuclear Spectroscopy and the Structure of the Atomic Nucleus, Nauka, Leningrad (1988), p. 564.
Additional information
FTI NPO “Fizika-Solntse” Academy of Sciences of the Uzbek Republic. Translated from Atomnaya Énergiya, Vol. 75, No. 2, pp. 159–161, August, 1993.
Rights and permissions
About this article
Cite this article
Muminov, R.A., Pod'yachev, V.N., Malaeva, V.T. et al. Effect of electron bombardment on the stabilization of the characteristics of silicon detectors with a thin “dead” layer. At Energy 75, 665–668 (1993). https://doi.org/10.1007/BF00739006
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF00739006