Oxidation of Metals

, Volume 17, Issue 3–4, pp 223–233 | Cite as

X-ray topographic study of β-NiAl upon growth of an α-Al2O3 film

  • T. Homma
  • H. M. Hindam
  • Y. Pyun
  • W. W. Smeltzert


The Berg-Barrett X-ray topographic method was employed as a microstructural technique to seek correlations of the metal substructure to the morphological features of α-Al2O3 films grown on β-NiAl. An analysis of diffraction micrographs using {112} and {002} reflections from individual grains in β-NiAl revealed its subgrain structure to a depth of 30 μ. The dimensions of these subgrains were directly related to the density of oxide ridges in the α-Al2O3 films and to the dimensions and shapes of cavities at the NiAl-Al2O3 interface.

Key words

β-NiAl subgrain structure α-Al2O3 film 


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Copyright information

© Plenum Publishing Corporation 1982

Authors and Affiliations

  • T. Homma
    • 1
  • H. M. Hindam
    • 2
  • Y. Pyun
    • 1
  • W. W. Smeltzert
    • 2
  1. 1.Institute of Industrial ScienceUniversity of TokyoTokyoJapan
  2. 2.Institute for Materials ResearchMcMaster UniversityHamiltonCanada

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