Oxidation of Metals

, Volume 17, Issue 3–4, pp 223–233 | Cite as

X-ray topographic study of β-NiAl upon growth of an α-Al2O3 film

  • T. Homma
  • H. M. Hindam
  • Y. Pyun
  • W. W. Smeltzert
Article

Abstract

The Berg-Barrett X-ray topographic method was employed as a microstructural technique to seek correlations of the metal substructure to the morphological features of α-Al2O3 films grown on β-NiAl. An analysis of diffraction micrographs using {112} and {002} reflections from individual grains in β-NiAl revealed its subgrain structure to a depth of 30 μ. The dimensions of these subgrains were directly related to the density of oxide ridges in the α-Al2O3 films and to the dimensions and shapes of cavities at the NiAl-Al2O3 interface.

Key words

β-NiAl subgrain structure α-Al2O3 film 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    J. L. Smialek,Metall. Trans. 9A, 309 (1978).Google Scholar
  2. 2.
    H. M. Hindam and W. W. Smeltzer,J. Electrochem. Soc. 127, 1630 (1980).Google Scholar
  3. 3.
    H. M. Hindam and W. W. Smeltzer,J. Oxid. Met.,14, 337 (1980).Google Scholar
  4. 4.
    R. Hutchings, M. H. Loretto, and R. E. Smallman,Met. Sci.,15, 7 (1981).Google Scholar
  5. 5.
    C. S. Barrett and T. B. Massalski,Structure of Metals (McGraw-Hill, New York, 1966).Google Scholar
  6. 6.
    M. Yoshimatsu, A. Shibata, and K. Kohra,Advances in X-Ray Analysis Vol. 9 (Plenum Press, New York, 1966).Google Scholar
  7. 7.
    J. B. Newkirk,Trans. AIME,215, 483 (1959).Google Scholar
  8. 8.
    B. D. Cullity,Elments of X-Ray Diffraction (Addison-Wesley, Reading, 1956).Google Scholar
  9. 9.
    J. W. Rutter and B. Chalmers,Can. J. Phys. 31, 15 (1953).Google Scholar
  10. 10.
    M. M. P. Janssen and G. D. Reick,Trans. AIME 239, 1372 (1967).Google Scholar
  11. 11.
    Y. Oishi and W. D. Kingery,J. Chem. Phys. 33, 480 (1960).Google Scholar
  12. 12.
    A. E. Paladino and W. D. Kingery,J. Chem. Phys. 37, 957 (1962).Google Scholar

Copyright information

© Plenum Publishing Corporation 1982

Authors and Affiliations

  • T. Homma
    • 1
  • H. M. Hindam
    • 2
  • Y. Pyun
    • 1
  • W. W. Smeltzert
    • 2
  1. 1.Institute of Industrial ScienceUniversity of TokyoTokyoJapan
  2. 2.Institute for Materials ResearchMcMaster UniversityHamiltonCanada

Personalised recommendations