Abstract
The effect of the structure YBa2Cu3O7-x superconducting thin films on microwave surface resistance was investigated. The electon channeling patterns (ECPs) and X-ray experimental results showed that the microwave surface resistanceR s is strongly correlated with the perfection of the thin films. The films were deposited on LaAlO3(100) and YSZ(100) substrates. For thin film withR s of 280μΩ, the crystallinity of the thin film shown byw-scanning andφ-scanning was excellent and the ECPs were very sharp. For thin film with highR s of 98 mΩ, only bands from the major zone were visible in the ECPs, which suggested poor crystallinity of the film. From this investigation it was shown that the more perfect the thin films, the lower theR s.
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Xu, S.F., Tian, Y.J., Lü, H.B. et al. Dependence of microwave surface resistance on the structure of laser-deposited YBa2Cu3O7−x thin films. J Supercond 8, 287–291 (1995). https://doi.org/10.1007/BF00732382
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DOI: https://doi.org/10.1007/BF00732382