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Infrared spectroscopic and X-ray diffraction characterization of iron disulphide thin films prepared by metal-organic chemical vapour deposition

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Abteilung Solar Energetik und Material Forschung, Glienicker Straβe 100, D-1000, Berlin 39, FRG

    A. Ennaoui, S. Schroetter, S. Fiechter & H. Tributsch

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  1. A. Ennaoui
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  2. S. Schroetter
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  3. S. Fiechter
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  4. H. Tributsch
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Ennaoui, A., Schroetter, S., Fiechter, S. et al. Infrared spectroscopic and X-ray diffraction characterization of iron disulphide thin films prepared by metal-organic chemical vapour deposition. J Mater Sci Lett 11, 1131–1133 (1992). https://doi.org/10.1007/BF00730854

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  • DOI: https://doi.org/10.1007/BF00730854

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