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High resolution transmission electron microscopy (HRTEM) of epitaxially grown ZnSe and ZnSe/GaAs interfaces

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Journal of Materials Science Letters

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Author notes

  1. J. O. Williams

    Present address: UMIST, PO Box 88, M60 1QD, Manchester

Authors and Affiliations

  1. Edward Davies Chemical Laboratories, University College of Wales, Aberystwyth, Wales, UK

    J. O. Williams, E. S. Crawford, J. LL. Jenkins, T. L. NG, A. M. Patterson & M. D. Scott

  2. Royal Signals and Radar Establishment, St. Andrew's Road, Great Malvern, England, UK

    B. Cockayne & P. J. Wright

Authors
  1. J. O. Williams
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  2. E. S. Crawford
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  3. J. LL. Jenkins
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  4. T. L. NG
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  5. A. M. Patterson
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  6. M. D. Scott
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  7. B. Cockayne
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  8. P. J. Wright
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Williams, J.O., Crawford, E.S., Jenkins, J.L. et al. High resolution transmission electron microscopy (HRTEM) of epitaxially grown ZnSe and ZnSe/GaAs interfaces. J Mater Sci Lett 3, 189–193 (1984). https://doi.org/10.1007/BF00726789

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  • DOI: https://doi.org/10.1007/BF00726789

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